Radiation Reports

Following are radiation reports for some of our products. Please note that these reports were current as of August 2003. The latest version of the reports are always available on our web site at www.maxwell.com

Please note: These reports are in Adobe PDF format. To view them you will need the free Adobe Reader software installed on your computer. If you do not have it installed currently, you can download the correct version here.

• 256 Meg SDRAM - Single Event Effects (SEE) Radiation Test Report
  
• 256 Meg SDRAM - Total Ionizing Dose (TID) Radiation Test Report
  
• 4 Meg SRAM - Summary Radiation Test Report
  
• 1 Meg EEPROM - Summary Radiation Test Report
  
• 256 k PROM - Summary Radiation Test Report
  
• 1 Meg PROM - Summary Radiation Test Report
  
• 29F0408 32 Mb Flash Memory - Summary Radiation Test Report
  
• 7025 Dual Port Ram - Summary Radiation Test Report
  
• 7684 8 Bit A/D Converter - Summary Radiation Test Report
  
• 7809LP 16 Bit A/D Converter - Summary Radiation Test Report
  
• 7872 14 Bit A/D Converter - Summary Radiation Test Report
  
• 8143RP 12 Bit Serial D/A Converter - Total Dose Radiation Test Report
  
• 9240LP 14 Bit A/D Converter - Total Dose Radiation Test Report
  
• 7B991 Programmable Skew Clock Buffer - Summary Radiation Test Report
  
• 54BCT245 Octal Transceiver - Single Event Latch-up Radiation Test Report