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Following are several presentations which will provide more detailed information about some of our products and the technology that makes them possible.
Please note: These presentations are in
Adobe PDF format. To view them you will need the free Adobe Reader
software installed on your computer. If you do not have it installed currently,
you can download the correct version here.
Space Processor Radiation Mitigation and Validation
Techniques for an 1800 MIPS Processor Board
Presented by Maxwell
Technologies in association with Jet Propulsion Laboratory / California Institute
of Technology at RADECS 2003, this presentation compares the advances in
both commercial and Rad-Hard processors, examines the SCS750 design strategy,
development plan, and advanced radiation mitigation techniques, summarizes
heavy ion test results and provides a comparative analysis of the single
event upset performance of both the SCS750 and the RAD6000.
High Performance,
Fault Tolerant Computing in Space
Presented at HPEC 2003, this presentation
examines the benefits offered by the industry leading SCS750 Super Computer for
Space.
SPWG 2003
Presented at the 2003 Space Parts Working Group conference,
this is an update to Maxwell's current new product developments and latest radiation
mitigation technologies including new packaging designs.
Nuclear Event Detectors (NED) Product Line
This presentation covers the Maxwell Technologies Microelectronic Nuclear Event Detector product line.
Nuclear Circumvention
This presentation examines the benefits of nuclear circumvention and how Maxwell Technologies' Nuclear Event Detector can play a vital role.
Nuclear Weapons vs Natural Space Radiation
This presentation contrasts the radiation produced by nuclear weapons and natural space radiation and shows how Maxwell Technologies' Nuclear Event Detector can detect both types.
ASIC
for Single Event Latch-up Protection of Integrated Circuits
Presented at the SEE Symposium 2000, this presentation
covers the ability of Maxwell' Latch-up Protection Technology (LPT™) to
limit the current to a device; detect above threshold current levels caused by
a SEL event; subsequent initiation and maintenance of forced shutdown to allow
dissipation of the latch-up current, and; returning the device supply voltage
to pre-event operation levels.
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