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Following are several application notes which relate to our products.
Please note: These papers are in Adobe Acrobat PDF format. To view them you will need the free Adobe Acrobat Reader software installed on your computer. If you do not have it installed currently, you can download the correct version here.
7206F
FIFO Read Problem
Maxwell has become aware of a problem with the Atmel
62706F FIFO. This error was identified by the European Space Agency as shown
in the attached ESA Alert, EA-2002-EEE-02-A. The error occurs when the next
to last word in the FIFO is being read and a write to the FIFO occurs too close
to that read. If the leading edge of the write occurs within 11 ns of the trailing
edge of the read then the last word in the FIFO can be lost.
79C0832
Document Change Notice
Outlines additions made to the electrical
characteristics of the 79C0832 datasheet.
79LV0832 Document Change Notice
Outlines additions made to the electrical characteristics of the 79LV0832
datasheet.
Heterojunction Bipolar Transistor (HBT) Die Information
Heterojunction Bipolar Transistor (HBT) die technology is not found in
any of Maxwell's standard products. Hitachi 1Mbit EEPROM - Hitachi Die HN58C1001
Over the last several months several design applications questions have been asked regarding the Hitachi EEPROM. These questions have been to both clarify the datasheet specifications as well as obtain additional information not contained in the datasheet. This application note documents the answers that Maxwell has received from Hitachi.
Introduction
to SDRAM
This document describes the architecture
and features of Maxwell Technologies Synchronous DRAM (SDRAM). A brief discussion
of a conventional Dynamic Random Access Memory (DRAM) provides background
information on the evolution of the industry standard architecture to the
SDRAM. NED Reliability Report
The purpose of this report is to document the predicted reliability of the Nuclear Event
Detector (NED) products.
Nuclear
Circumvention
This presentation examines the benefits of nuclear
circumvention and how Maxwell Technologies' Nuclear Event Detector can
play a vital role.
Programming
the 79C0408 4 Mbit EEPROM
This document describes the hardware and programming
methodology used to program a 79C0408 EEPROM.
Programming
the 27C1512T EPROM
This document describes the hardware and programming
methodology used to program a 27C1512T one time programmable EPROM. |
